High quality ZnS/Au/ZnS transparent conductive tri-layer films deposited by pulsed laser deposition
- Авторлар: Wang C.1,2, Li Q.1,3, Wang J.1, Zhang L.3, Zhao F.3, Dong F.3
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Мекемелер:
- College of Physics and Engineering
- Aeronautical Engineering College
- School of Physics and Optoelectronic Engineering
- Шығарылым: Том 121, № 1 (2016)
- Беттер: 68-71
- Бөлім: Condensed-Matter Spectroscopy
- URL: https://journal-vniispk.ru/0030-400X/article/view/164903
- DOI: https://doi.org/10.1134/S0030400X16070080
- ID: 164903
Дәйексөз келтіру
Аннотация
ZnS/Au/ZnS tri-layer films were deposited on quartz glass substrates by pulsed laser deposition. The influence of Au layer thickness on optical and electrical properties of the tri-layer ZnS/Au/ZnS was studied. X-ray diffractometer (XRD) and scanning electron microscope were employed to characterize the crystalline structure and surface morphology of the tri-layer films. Hall measurements, ultraviolet and visible spectrophotometer, four-point probe were used to explore the optoelectronic properties of the ZnS/Au/ZnS. The increase of Au layer thickness resulted in the decreased resistivity, the increased carrier concentration, and the declined transmittance in the visible light region.
Авторлар туралы
Caifeng Wang
College of Physics and Engineering; Aeronautical Engineering College
Хат алмасуға жауапты Автор.
Email: cfwang_2004@163.com
ҚХР, Qufu, 273165; Binzhou, 256603
Qingshan Li
College of Physics and Engineering; School of Physics and Optoelectronic Engineering
Email: cfwang_2004@163.com
ҚХР, Qufu, 273165; Yantai, 264025
Jisuo Wang
College of Physics and Engineering
Email: cfwang_2004@163.com
ҚХР, Qufu, 273165
Lichun Zhang
School of Physics and Optoelectronic Engineering
Email: cfwang_2004@163.com
ҚХР, Yantai, 264025
Fengzhou Zhao
School of Physics and Optoelectronic Engineering
Email: cfwang_2004@163.com
ҚХР, Yantai, 264025
Fangying Dong
School of Physics and Optoelectronic Engineering
Email: cfwang_2004@163.com
ҚХР, Yantai, 264025
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