On Diffraction Phenomena in Sensors of Surface Waves


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Resumo

The diffraction phenomena associated with the limited aperture size of an incident wave are considered on the basis of a theoretical method for studying the reflection of a plane electromagnetic wave from a plane-layered multifilm structure with homogeneous films. The proposed theory is applied to the analysis of the sensitivity of sensors based on surface waves.

Sobre autores

A. Petrin

Joint Institute of High Temperatures

Autor responsável pela correspondência
Email: a_petrin@mail.ru
Rússia, Moscow, 125412

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