Nanoporosity of Si (100) bars


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Resumo

Si(100) samples cut from a typical bar (100 mm in diameter) prepared using industrial technology are studied. Measurements of the electron work function (EWF) show that the size effects in these samples (a reduction in thickness along with a sample’s area and the EWF) detected earlier were due to nanostructure porosity that was buried by the technological treatment of a bar’s surface. This hidden nanoporosity is assumed to be a manifestation of the secondary crystal structure.

Sobre autores

N. Gerasimenko

National Research University of Electronic Technology (MIET); Lebedev Institute of Physics; National Research Tomsk State University

Email: aviary@mail.ru
Rússia, Moscow, 124498; Moscow, 119991; Tomsk, 634050

D. Smirnov

National Research University of Electronic Technology (MIET); Lebedev Institute of Physics

Email: aviary@mail.ru
Rússia, Moscow, 124498; Moscow, 119991

S. Novikov

National Research University of Electronic Technology (MIET)

Autor responsável pela correspondência
Email: aviary@mail.ru
Rússia, Moscow, 124498

S. Timoshenkov

National Research University of Electronic Technology (MIET)

Email: aviary@mail.ru
Rússia, Moscow, 124498

V. Minaev

National Research University of Electronic Technology (MIET)

Email: aviary@mail.ru
Rússia, Moscow, 124498

E. Goryunova

National Research University of Electronic Technology (MIET)

Email: aviary@mail.ru
Rússia, Moscow, 124498

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