Influence of the magnetization-distribution nonuniformity on the sensitivity of anisotropic magnetoresistive sensors

Abstract

The specific features of numerical calculation of the magnetization-reversal process in thin-film components with large linear dimensions and a complex topology in relation to magnetoresistive transducers (sensors) are considered. The calculated value of the sensor sensitivity obtained within the framework of a uniform and micromagnetic magnetization-reversal model is compared with experimental data. Calculations of the magnetization-reversal process within the framework of the micromagnetic model show the positive effect of edge magnetization pinning which is manifested in the mutual compensation of current and magnetization- distribution nonuniformities; it can be used to enhance the sensitivity of anisotropic magnetoresistive (AMR) sensors.