Measurements of electrophysical properties of metal microcontacts using fractal geometry methods for the analysis of atomic-force-microscopy data

Abstract

A new approach to analyzing the conductivity of metal microcontacts of the fractal type is proposed. It is shown that the resistance of such a microcontact depends strongly on its morphology (total characteristic including the size, shape, and spatial organization, which are determined by atomic force microscopy). A method for calculating the resistance of a microcontact by measuring its height map is proposed.