Informaçao sobre o Autor
Ergashov, Y. S.
| Edição | Seção | Título | Arquivo |
| Volume 62, Nº 5 (2017) | Physics of Nanostructures | Composition and properties of nanoscale Si structures formed on the CoSi2/Si(111) surface by Ar+ ion bombardment | |
| Volume 63, Nº 12 (2018) | Solid State Electronics | Structure and Properties of a Bilayer Nanodimensional CoSi2/Si/CoSi2/Si System Obtained by Ion Implantation | |
| Volume 64, Nº 7 (2019) | Physical Electronics | Escape Depth of Secondary and Photoelectrons from CdTe Films with a Ba Film |