Автор туралы ақпарат

Drozdov, Yu. N.

Шығарылым	Бөлім	Атауы	Файл
Том 42, № 3 (2016)	Article	Nonlinear calibration curves in secondary ion mass spectrometry for quantitative analysis of gesi heterostructures with nanoclusters
Том 42, № 8 (2016)	Article	Extremely deep profiling analysis of the atomic composition of thick (>100 μm) GaAs layers within power PIN diodes by secondary ion mass spectrometry
Том 43, № 5 (2017)	Article	Selective analysis of the elemental composition of InGaAs/GaAs nanoclusters by secondary ion mass spectrometry
Том 44, № 4 (2018)	Article	New Cluster Secondary Ions for Quantitative Analysis of the Concentration of Boron Atoms in Diamond by Time-of-Flight Secondary-Ion Mass Spectrometry
Том 44, № 4 (2018)	Article	A New Limitation of the Depth Resolution in TOF-SIMS Elemental Profiling: the Influence of a Probing Ion Beam
Том 45, № 1 (2019)	Article	A New Approach to TOF-SIMS Analysis of the Phase Composition of Carbon-Containing Materials