Length of diagnostic tests for Boolean circuits

Authors: Red’kin N.P.¹
Affiliations:
1. Lomonosov Moscow State University
Issue: Vol 102, No 3-4 (2017)
Pages: 580-582
Section: Short Communications
URL: https://journal-vniispk.ru/0001-4346/article/view/150216
DOI: https://doi.org/10.1134/S0001434617090310
ID: 150216

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Abstract
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Keywords

Boolean function, Boolean circuit, circuit diagnostic test

About the authors

N. P. Red’kin

Lomonosov Moscow State University

Author for correspondence.
Email: npredkin@mail.ru
Russian Federation, Moscow

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