Photosensitivity of pSi-n(Si2)1–xy(Ge2)x(ZnSe)y heterostructures with quantum dots


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Abstract

The spectral dependences of photosensitivity of pSi-n(Si2)1–xy(Ge2)x(ZnSe)y heterostructures and structural features of epitaxial film of (Si2)1–xy(Ge2)x(ZnSe)y solid solution were studied by atomic force microscopy. The peaks of sensitivity at photon energies of 1.60, 1.85, 2.40, and 2.54 eV due to ZnSe and Ge quantum dots in the solid solution layer were revealed.

About the authors

A. S. Saidov

Physics–Sun Scientific and Production Association, Institute of Physics and Technology

Author for correspondence.
Email: amin@uzsci.uz
Uzbekistan, Tashkent, 100084

Sh. N. Usmonov

Physics–Sun Scientific and Production Association, Institute of Physics and Technology

Author for correspondence.
Email: kvant@mail.ru
Uzbekistan, Tashkent, 100084

K. A. Amonov

Physics–Sun Scientific and Production Association, Institute of Physics and Technology

Email: kvant@mail.ru
Uzbekistan, Tashkent, 100084

M. S. Saidov

Physics–Sun Scientific and Production Association, Institute of Physics and Technology

Email: kvant@mail.ru
Uzbekistan, Tashkent, 100084

B. R. Kutlimuratov

Islam Karimov State Technical University

Email: kvant@mail.ru
Uzbekistan, Tashkent, 100095

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