Morphology and Photoelectric Characteristics of the Thin-Film Polycrystalline Structure SnO2-CdS/Cu(InGa)Se2-Ag


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Abstract

The surface morphology and photoelectric characteristics of a thin-film SnO2-CdS/Cu(InGa)Se2-Ag heterostructure have been studied. The chemical and phase composition of the Cu(InGa)Se2 film in the synthesized structure have been investigated. The current transfer mechanism has been studied, and the main parameters of the semiconductor material have been determined. It has been found that there are no oppositely connected barriers in the heterostructure.

About the authors

R. R. Kobulov

International Solar Energy Institute

Author for correspondence.
Email: krr1982@bk.ru
Uzbekistan, Tashkent

N. A. Matchanov

International Solar Energy Institute

Email: krr1982@bk.ru
Uzbekistan, Tashkent

O. K. Ataboyev

International Solar Energy Institute

Email: krr1982@bk.ru
Uzbekistan, Tashkent

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