Email this article Sas_analyzer software for small-angle X-ray scattering data treatment
- Authors: Poluyanov S.A.1, Tuzikov F.V.1, Larichev Y.V.1,2, Tsybulya S.V.1,2
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Affiliations:
- Boreskov Institute of Catalysis, Siberian Branch
- Novosibirsk National Research State University
- Issue: Vol 57, No 4 (2016)
- Pages: 771-776
- Section: Article
- URL: https://journal-vniispk.ru/0022-4766/article/view/160012
- DOI: https://doi.org/10.1134/S0022476616040211
- ID: 160012
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Abstract
New approaches to the analysis of small-angle X-ray scattering data from nanoscale systems based on the optimization and direct multiple shooting methods are presented. A program is developed, which bears on these new approaches and allows a user to model small-angle X-ray diffraction data, introduce collimation corrections, and analyze dispersions in the samples. The program results for a number of typical nanosized systems (sols, catalysts) are reported and the comparison with currently available programs for small-angle data processing is presented.
About the authors
S. A. Poluyanov
Boreskov Institute of Catalysis, Siberian Branch
Email: ylarichev@gmail.com
Russian Federation, Novosibirsk
F. V. Tuzikov
Boreskov Institute of Catalysis, Siberian Branch
Email: ylarichev@gmail.com
Russian Federation, Novosibirsk
Yu. V. Larichev
Boreskov Institute of Catalysis, Siberian Branch; Novosibirsk National Research State University
Author for correspondence.
Email: ylarichev@gmail.com
Russian Federation, Novosibirsk; Novosibirsk
S. V. Tsybulya
Boreskov Institute of Catalysis, Siberian Branch; Novosibirsk National Research State University
Email: ylarichev@gmail.com
Russian Federation, Novosibirsk; Novosibirsk
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