Email this article Study of the ZnSxSe1–x@Al2O3 nanostructures by X-ray diffraction and EXAFS spectroscopy
- Authors: Chukavin A.I.1, Valeev R.G.1, Zubavichus Y.V.2, Trigub A.L.1,2, Beltyukov A.N.1
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Affiliations:
- Institute of Physics and Technology, Ural Branch
- National Research Center “Kurchatov Institute”
- Issue: Vol 58, No 6 (2017)
- Pages: 1236-1244
- Section: Article
- URL: https://journal-vniispk.ru/0022-4766/article/view/161594
- DOI: https://doi.org/10.1134/S0022476617060233
- ID: 161594
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Abstract
Nanocomposite systems based on ternary ZnSxSe1–x semiconductor compounds with different compositions (x = 0, 0.3, 0.5, 0.7, 1) in dielectric matrices of nanoporous anodic aluminium oxide (AAO) are synthesized by high vacuum thermal evaporation of a zinc sulfide and selenide powder mixture. The effect of the atomic concentration of solid solutions and the structural parameters of the AAO template matrix on the crystal structure of the synthesized nanocomposites and the local atomic environment of Zn and Se atoms is investigated.
About the authors
A. I. Chukavin
Institute of Physics and Technology, Ural Branch
Author for correspondence.
Email: andrey_chukavin@mail.ru
Russian Federation, Izhevsk
R. G. Valeev
Institute of Physics and Technology, Ural Branch
Email: andrey_chukavin@mail.ru
Russian Federation, Izhevsk
Ya. V. Zubavichus
National Research Center “Kurchatov Institute”
Email: andrey_chukavin@mail.ru
Russian Federation, Moscow
A. L. Trigub
Institute of Physics and Technology, Ural Branch; National Research Center “Kurchatov Institute”
Email: andrey_chukavin@mail.ru
Russian Federation, Izhevsk; Moscow
A. N. Beltyukov
Institute of Physics and Technology, Ural Branch
Email: andrey_chukavin@mail.ru
Russian Federation, Izhevsk
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