High-Temperature X-Ray Diffraction Investigation of the Decomposition Process in Manganese-Gallium Spinel Mn1.5Ga1.5O4

Abstract

The stability of spinel-type mixed Mn_1.5Ga_1.5O₄ oxide prepared in an inert medium (1000 °C, Ar) is studied by thermogravimetry and high-temperature X-ray diffraction in air in a wide temperature range 30–1000 °C. On heating, reversible decomposition processes of initial spinel are observed. From 30 °C to 600 °C oxygen atoms attach to the surface layer of initial Mn_1.5Ga_1.5O₄ spinel to form a new phase distinct from parent oxide by the oxygen stoichiometry (cation vacancies are formed). The product of decomposition is two oxides: Mn_1.5Ga_1.5O₄ and Mn_1.5–xGa_1.5–x[·]_xO₄. On the contrary, above 600 °C a loss of oxygen occurs, the concentration of cation vacancies decreases in Mn_1.5–xGa_1.5–x[·]_xO₄, and the reverse process of single phase oxide crystallization takes place. At 1000 °C the spinel phase forms again whose composition is similar to that of the initial parent phase Mn_1.5Ga_1.5O₄. On cooling the decomposition of this phase is again observed due to oxygen attachment.