Email this article Minimal Complete Fault Detection Tests for Circuits of Functional Elements in Standard Basis
- Authors: Popkov K.A.1
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Affiliations:
- Keldysh Institute of Applied Mathematics
- Issue: Vol 74, No 4 (2019)
- Pages: 171-173
- Section: Brief Communications
- URL: https://journal-vniispk.ru/0027-1322/article/view/164879
- DOI: https://doi.org/10.3103/S0027132219040077
- ID: 164879
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Abstract
for each Boolean function we calculate the exact value of the minimal possible length of a complete fault detection test for logic networks implementing this function in the basis “conjunction, disjunction, negation” under one-type stuck-at faults at outputs of gates.
About the authors
K. A. Popkov
Keldysh Institute of Applied Mathematics
Author for correspondence.
Email: kirill-formulist@mail.ru
Russian Federation, Miusskaya sq., 4, Moscow, 125047
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