Measurement of the stress state of materials by reflection of polarization-modulated light
- Authors: Kniazkov A.V.1
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Affiliations:
- Peter the Great St. Petersburg Polytechnic University
- Issue: Vol 122, No 2 (2017)
- Pages: 338-340
- Section: Geometrical and Applied Optics
- URL: https://journal-vniispk.ru/0030-400X/article/view/165336
- DOI: https://doi.org/10.1134/S0030400X1702014X
- ID: 165336
Cite item
Abstract
A method for measuring mechanical stresses of photoelastic materials from the difference between the reflection coefficients of orthogonally polarized light waves incident on the surface of the stressed medium is considered. Comparative results of measurements of the stress state of polymethylmethacrylate in the conventional transmission polarization optical scheme and by the proposed refraction method are presented. A case of normal light incidence is considered.
About the authors
A. V. Kniazkov
Peter the Great St. Petersburg Polytechnic University
Author for correspondence.
Email: kniazkov@rphf.spbstu.ru
Russian Federation, St. Petersburg, 195251
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