Influence of the Interface State on the Magnetoresistive Properties of Co/Cu Superlattices

Abstract

The influence of the interface structure on the magnetoresistive properties of Co/Cu superlattices has been studied using the techniques of nuclear magnetic resonance and X-ray reflectivity. It has been found that the roughness of interfaces and the number of cobalt atoms involved in their formation increase with annealing temperature, while the fraction of highly perfect interfaces decreases at higher temperatures. It has been demonstrated that the probability of the scattering of conduction electrons by interfaces increases with the width of these boundaries.