Influence of High-Temperature Annealing of the Textured Metal Ni–W Substrate on the Structural Properties of Seed Layer in HTS 2G tapes


Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

The surface reconstruction of the textured metal tapes at the temperatures typical for the formation of the seed buffer Y2O3 layer of HTS 2G tapes have been revealed and studied for the first time. The influence of a terrace structure of the substrate surface on the characteristics of the texture of the seed Y2O3 layer has been shown. This effect is critically important to the deposition of buffer layers on the moving tape and allows to expand the temperature range of growth, in which the full inheritance of substrate texture by the seed Y2O3 layer is occurred.

Авторлар туралы

M. Chernykh

National Research Center Kurchatov Institute

Хат алмасуға жауапты Автор.
Email: garaeva-maria@yandex.ru
Ресей, Moscow, 123182

T. Krylova

National Research Center Kurchatov Institute

Email: garaeva-maria@yandex.ru
Ресей, Moscow, 123182

I. Kulikov

National Research Center Kurchatov Institute

Email: garaeva-maria@yandex.ru
Ресей, Moscow, 123182

I. Chernykh

National Research Center Kurchatov Institute

Email: garaeva-maria@yandex.ru
Ресей, Moscow, 123182

M. Zanaveskin

National Research Center Kurchatov Institute

Email: garaeva-maria@yandex.ru
Ресей, Moscow, 123182

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