Near-Field Resonance Microwave Tomography and Holography
- Авторы: Gaikovich K.P.1,2, Smirnov A.I.2,3, Yanin D.V.3
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Учреждения:
- Institute for Physics of Microstructures of the Russian Academy of Sciences
- N. I. Lobachevsky State University of Nizhny Novgorod
- Institute of Applied Physics of the Russian Academy of Sciences
- Выпуск: Том 60, № 9 (2018)
- Страницы: 733-749
- Раздел: Article
- URL: https://journal-vniispk.ru/0033-8443/article/view/243833
- DOI: https://doi.org/10.1007/s11141-018-9842-2
- ID: 243833
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Аннотация
We develop the methods of electromagnetic computer near-field microwave tomography of distributed subsurface inhomogeneities of complex dielectric permittivity and of holography (shape retrieval) of internally homogeneous subsurface objects. The methods are based on the solution of the near-field inverse scattering problem from measurements of the resonance-parameter variations of microwave probes above the medium surface. The capabilities of the proposed diagnostic technique are demonstrated in the numerical simulation for sensors with a cylindrical capacitor as a probe element, the edge capacitance of which is sensitive to subsurface inhomogeneities.
Об авторах
K. Gaikovich
Institute for Physics of Microstructures of the Russian Academy of Sciences; N. I. Lobachevsky State University of Nizhny Novgorod
Автор, ответственный за переписку.
Email: gaikovich@mail.ru
Россия, Nizhny Novgorod; Nizhny Novgorod
A. Smirnov
N. I. Lobachevsky State University of Nizhny Novgorod; Institute of Applied Physics of the Russian Academy of Sciences
Email: gaikovich@mail.ru
Россия, Nizhny Novgorod; Nizhny Novgorod
D. Yanin
Institute of Applied Physics of the Russian Academy of Sciences
Email: gaikovich@mail.ru
Россия, Nizhny Novgorod
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