Molecular Layer Deposition of Silicon Nitride with Glow Discharge Activation


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Abstract

The formation of silicon-nitrogen nanolayers obtained by molecular layer deposition on the GaAs surface with (100) and (110) orientations in the temperature range 473–773 K with discharge activation at the ammonia supply stage was studied. The conditions for growth of silicon nitride nanostructures and the layer mechanism of their formation were determined.

About the authors

Yu. K. Ezhovskii

St. Petersburg State Technological Institute (Technical University)

Author for correspondence.
Email: office@technolog.edu.ru
Russian Federation, St. Petersburg, 190013

S. V. Mikhailovskii

St. Petersburg State Technological Institute (Technical University)

Email: office@technolog.edu.ru
Russian Federation, St. Petersburg, 190013

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