Semiconductor Sensors for Studying the Heterogeneous Destruction of Ozone at Low Concentrations
- Authors: Obvintseva L.A.1, Sharova T.B.1, Avetisov A.K.1, Sukhareva I.P.1
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Affiliations:
- Karpov Institute of Physical Chemistry
- Issue: Vol 92, No 6 (2018)
- Pages: 1099-1106
- Section: To the 100Th Anniversary of the Karpov Institute of Physical Chemistry
- URL: https://journal-vniispk.ru/0036-0244/article/view/170024
- DOI: https://doi.org/10.1134/S0036024418060122
- ID: 170024
Cite item
Abstract
Prospects for the use of semiconductor resistive sensors in studies of the heterogeneous destruction of ozone at low concentrations (5–400 μg/m3) were shown. The influence of various factors (sensor temperature, gas flow rate, ozone concentration) on the results of ozone concentration measurements with sensors of various types was studied. Methods for forming a sensitive layer of In2O3(3% Fe2O3) sensors with specified parameters of calibration curves were proposed. The optimum conditions for the operation of sensors in a flow mode were formulated. The results of the study of heterogeneous destruction of ozone on microfiber polymer and natural disperse (sand, coals) materials obtained by the developed method were presented.
About the authors
L. A. Obvintseva
Karpov Institute of Physical Chemistry
Author for correspondence.
Email: obvint@yandex.ru
Russian Federation, Moscow, 105064
T. B. Sharova
Karpov Institute of Physical Chemistry
Email: obvint@yandex.ru
Russian Federation, Moscow, 105064
A. K. Avetisov
Karpov Institute of Physical Chemistry
Email: obvint@yandex.ru
Russian Federation, Moscow, 105064
I. P. Sukhareva
Karpov Institute of Physical Chemistry
Email: obvint@yandex.ru
Russian Federation, Moscow, 105064
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