FEATURES OF ANISOTROPY IN NARROW STRIPS OF THIN MAGNETIC FILMS DEPOSITED IN A CONSTANT MAGNETIC FIELD
- Authors: Belyaev B.A.1,2, Boev N.M.1,3, Skomorokhov G.V.1, Solov'ev P.N.1, Luk'yanenko A.V.1,3, Gorchakovskiy A.A.1, Podshivalov I.V.1, Izotov A.V.1,3
-
Affiliations:
- Kirensky Institute of Physics Siberian Branch of the Russian Academy of Sciences
- Reshetnev Siberian State University of Science and Technology
- Siberian Federal University
- Issue: Vol 165, No 5 (2024)
- Pages: 700-709
- Section: Articles
- URL: https://journal-vniispk.ru/0044-4510/article/view/259030
- DOI: https://doi.org/10.31857/S0044451024050092
- ID: 259030
Cite item
Abstract
Strips with a length of 20 mm and width from 0.1 to 2 mm were fabricated by laser lithography from permalloy (Fe20Ni80) films with thicknesses of 50, 100, and 200 nm, obtained by magnetron sputtering on quartz substrates. In the first series of samples, the uniaxial magnetic anisotropy induced by the presence of a constant magnetic field in the film plane during deposition was oriented along the long axes of the strips, and in the second series perpendicular to them. The anisotropic properties of the samples were determined from the angular dependencies of ferromagnetic resonance fields measured on a scanning spectrometer. It was found that in the first series of samples, with decreasing strip width, the anisotropy monotonically increases several times while barely changing its direction. In the samples of the second series, it first decreases almost to zero at a certain strip width, and then rapidly grows while simultaneously rotating by ~ 90◦. The phenomenological calculation of uniaxial anisotropy in uniformly magnetized film strips shows good agreement with the experiment.
About the authors
B. A. Belyaev
Kirensky Institute of Physics Siberian Branch of the Russian Academy of Sciences; Reshetnev Siberian State University of Science and Technology
Email: belyaev@iph.krasn.ru
Russian Federation, 660036, Krasnoyarsk; 660014, Krasnoyarsk
N. M. Boev
Kirensky Institute of Physics Siberian Branch of the Russian Academy of Sciences; Siberian Federal University
Email: belyaev@iph.krasn.ru
Russian Federation, 660036, Krasnoyarsk; 660041, Krasnoyarsk
G. V. Skomorokhov
Kirensky Institute of Physics Siberian Branch of the Russian Academy of Sciences
Email: belyaev@iph.krasn.ru
Russian Federation, 660036, Krasnoyarsk
P. N. Solov'ev
Kirensky Institute of Physics Siberian Branch of the Russian Academy of Sciences
Email: belyaev@iph.krasn.ru
Russian Federation, 660036, Krasnoyarsk
A. V. Luk'yanenko
Kirensky Institute of Physics Siberian Branch of the Russian Academy of Sciences; Siberian Federal University
Email: belyaev@iph.krasn.ru
Russian Federation, 660036, Krasnoyarsk; 660041, Krasnoyarsk
A. A. Gorchakovskiy
Kirensky Institute of Physics Siberian Branch of the Russian Academy of Sciences
Email: belyaev@iph.krasn.ru
Russian Federation, 660036, Krasnoyarsk
I. V. Podshivalov
Kirensky Institute of Physics Siberian Branch of the Russian Academy of Sciences
Email: belyaev@iph.krasn.ru
Russian Federation, 660036, Krasnoyarsk
A. V. Izotov
Kirensky Institute of Physics Siberian Branch of the Russian Academy of Sciences; Siberian Federal University
Author for correspondence.
Email: belyaev@iph.krasn.ru
Russian Federation, 660036, Krasnoyarsk; 660041, Krasnoyarsk
References
- Р. Суху, Магнитные тонкие пленки, Мир, Москва (1967).
- Н. М. Саланский, М. Ш. Ерухимов, Физические свойства и применение магнитных пленок, Наука, Новосибирск (1975).
- K. Barmak, K. Coffey, Metallic Films for Electronic, Optical and Magnetic Applications: Structure, Processing and Properties, Woodhead Publ, Oxford (2014).
- B. A. Belyaev, A. O. Afonin, A. V. Ugrymov et al., Rev. Sci. Instrum. 91, 114705 (2020).
- A. N. Lagarkov, K. N. Rozanov, J. Magn. Magn. Mater. 321, 2082 (2009).
- R. E. Camley, Z. Celinski, T. Fal et al., J. Magn. Magn. Mater. 321, 2048 (2009).
- А. Н. Бабицкий, Б. А. Беляев, Г. В. Скоморохов и др., Письма в ЖТФ 41, 36 (2015).
- А. Н. Бабицкий, Б. А. Беляев, Н. М. Боев и др., ПТЭ 3, 96 (2016).
- G. Yu. Melnikov, I. G. Vazhenina, R. S. Iskhakov et al., Sensors 23, 6165 (2023).
- А. Н. Лагарьков, С. А. Маклаков, А. В. Осипов и др., РЭ 5, 625 (2009).
- C. Kittel, Phys. Rev. 73, 155 (1948).
- J. Han-Min, C.-O. Kim, T.-D. Lee et al., Chinese Phys. 16, 3520 (2007).
- Б. А. Беляев, А. В. Изотов, С. Я. Кипарисов и др., ФТТ 50, 650, (2008).
- Y. Yang, B. Liu, D. Tang et al., J. Appl. Phys. 108, 073902 (2010).
- P. N. Solovev, A. V. Izotov, and B. A. Belyaev, J. Magn. Magn. Mater. 429, 45 (2017).
- Z. Ali, D. Basaula, K. F. Eid et al., Thin Solid Films 735, 138899 (2021).
- Б. А. Беляев, А. В. Изотов, ФТТ 49, 1651 (2007).
- Z. K. Wang, E. X. Feng, Q. F. Liu et al., Physica B: Cond. Matt. 407, 3872 (2012).
- C. Bayer, J. P. Park, H. Wang et al., Phys. Rev. B 69, 134401 (2004).
- С. Л. Высоцкий, С. А. Никитов, Ю. А. Филимонов и др., Письма в ЖЭТФ 88, 534 (2008).
- B. K. Kuanr, V. Veerakumar, L. M. Malkinski et al., IEEE Trans. Magn. 45, 3550 (2009).
- A. Garcia-Arribas, E. Fernandez, A. V. Svalov et al., Eur. Phys. J. B 86. 136 (2013).
- A. G. Kozlov, M. E. Stebliy, A. V. Ognev et al., IEEE Trans. Magn. 51, 2301604 (2015).
- E. V. Skorohodov, R. V. Gorev, R. R. Yakubov et al., J. Magn. Magn. Mater. 424, 118 (2017).
- A. G. Kozlov, M. E. Stebliy, A. V. Ognev et al., J. Magn. Magn. Mater. 422, 452 (2017).
- Z. Zhu, H. Feng, X. Cheng et al., J. Phys. D: Appl. Phys. 51, 045004 (2018).
- M. Haschke, J. Flock, and M. Haller, X-ray Fluorescence Spectroscopy for Laboratory Applications, Wiley-VCH, Weinheim (2021).
- Б. А. Беляев, А. В. Изотов, Письма в ЖЭТФ 103, 44 (2016).
- Б. А. Беляев, А. А. Лексиков, И. Я. Макиевский и др., ПТЭ 3, 106 (1997).
- B. A. Belyaev, A. V. Izotov, and A. A. Leksikov, IEEE Sensors J. 5, 260 (2005).
- Б. А. Беляев, Н. М. Боев, А. А. Горчаковский и др., ПТЭ 2, 107 (2021).
- А. В. Изотов, Б. А. Беляев, Свид. о гос. рег. прогр. для ЭВМ №2009616881 (2009).
- Л. Д. Ландау, Е. М. Лифшиц, Электродинамика сплошных сред, Наука, Москва (1982).
Supplementary files
