Enviar artigo por via de e-mail Dependence of Resonant Light Wavefront Reversal on Polaritons on the Optical Pump Intensity in Zinc Oxide Films
- Autores: Gruzintsev A.N.1
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Afiliações:
- Institute of Microelectronic Technology and Ultra-High-Purity Materials, Russian Academy of Sciences
- Edição: Volume 118, Nº 1-2 (7) (2023)
- Páginas: 23-29
- Seção: Articles
- URL: https://journal-vniispk.ru/0370-274X/article/view/141917
- DOI: https://doi.org/10.31857/S1234567823130062
- EDN: https://elibrary.ru/GAWRST
- ID: 141917
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Resumo
The possibility of resonant light wavefront reversal in an excited semiconductor medium has been demonstrated theoretically and experimentally. Induced light wavefront reversal in the infrared spectral range equal to half the energy of the radiative recombination of polaritons has been detected on epitaxial ZnO films under nitrogen laser pumping at room temperature. Dependences of the intensity of the wavefront reversal signal on the energy of the incident photon and the laser pump intensity have been examined.
Sobre autores
A. Gruzintsev
Institute of Microelectronic Technology and Ultra-High-Purity Materials, Russian Academy of Sciences
Autor responsável pela correspondência
Email: gran@iptm.ru
Chernogolovka, Moscow region, 142432 Russia
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