Test Code Correction of Errors in the Information Storage Devices of Measurement Systems

A. A. Pavlov; A. A. Burmistrov; A. N. Tsar’kov; D. A. Korsunskii; D. E. Sorokin; S. S. Neustroev; I. V. Robert

doi:10.1007/s11018-016-1068-0

Test Code Correction of Errors in the Information Storage Devices of Measurement Systems

Authors: Pavlov A.A.¹, Burmistrov A.A.¹, Tsar’kov A.N.², Korsunskii D.A.², Sorokin D.E.², Neustroev S.S.³, Robert I.V.³
Affiliations:
1. Peter the Great Military Academy of Strategic Missile Troops
2. Institute of Engineering Physics Interregional Public Institution
3. Institute of Educational Management, Russian Academy of Education
Issue: Vol 59, No 9 (2016)
Pages: 923-928
Section: Article
URL: https://journal-vniispk.ru/0543-1972/article/view/245490
DOI: https://doi.org/10.1007/s11018-016-1068-0
ID: 245490

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Abstract

A method of test-code correction of RAM errors is proposed. A linear code is used to detect new errors while the identification of hidden errors and the determination of the configuration (erroneous bits) of a multiple error and its correction are performed on the basis of the results of an analysis of a response reaction following a test action.