Email this article Microprocessor-Based System for Measuring the Modulus and Components of the Complex Resistance of a Two-Terminal Element in a Multiterminal Electrical Circuit
- Authors: Sharonov G.I.1, Nefed’ev A.I.2
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Affiliations:
- Penza State University of Architecture and Construction
- Volgograd State Technical University
- Issue: Vol 59, No 11 (2017)
- Pages: 1191-1196
- Section: Electromagnetic Measurements
- URL: https://journal-vniispk.ru/0543-1972/article/view/245977
- DOI: https://doi.org/10.1007/s11018-017-1114-6
- ID: 245977
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Abstract
We propose a microprocessor-based measurement system (MBMS) for measuring the modulus and components of the complex resistance of an individual two-terminal element and the complex resistance of a two-terminal element in a branch of a multiterminal electrical circuit (MTEC) of T type or H type with one and with two points that are inaccessible for connection of the complex resistance of the two-terminal element (CRTTE). We present the block diagram for the microprocessor-based measurement system and results of the study.
About the authors
G. I. Sharonov
Penza State University of Architecture and Construction
Author for correspondence.
Email: turboacs@gmail.com
Russian Federation, Penza
A. I. Nefed’ev
Volgograd State Technical University
Email: turboacs@gmail.com
Russian Federation, Volgograd
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