Calibration of Scanning Electron Microscopes over a Wide Range of Magnifications


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Abstract

A new method is proposed for calibrating scanning electron microscopes (SEM) with magnification in the 10–50000× range using an end gauge and an auxiliary structure. Use of a certified end gauge ensures traceability of the calibration results to the primary standard for the meter. The relative expanded uncertainty of measurements on an S-4800 SEM at magnifications of 1000, 10000, and 50000× is less than 0.14%.

About the authors

R. V. Kirtaev

Research Center for the Study of the Properties of Surfaces and Vacuum (NITsPV); Moscow Institute of Physics and Technology (State University)

Author for correspondence.
Email: fgupnicpv@mail.ru
Russian Federation, Moscow; Dolgoprudnyi, Moscow Region

A. Yu. Kuzin

All-Russia Research Institute of Metrological Service (VNIIMS)

Email: fgupnicpv@mail.ru
Russian Federation, Moscow

V. G. Maslov

Research Center for the Study of the Properties of Surfaces and Vacuum (NITsPV)

Email: fgupnicpv@mail.ru
Russian Federation, Moscow

V. B. Mityukhlyaev

Research Center for the Study of the Properties of Surfaces and Vacuum (NITsPV)

Email: fgupnicpv@mail.ru
Russian Federation, Moscow

P. A. Todua

Research Center for the Study of the Properties of Surfaces and Vacuum (NITsPV); Moscow Institute of Physics and Technology (State University)

Email: fgupnicpv@mail.ru
Russian Federation, Moscow; Dolgoprudnyi, Moscow Region

M. N. Filippov

Research Center for the Study of the Properties of Surfaces and Vacuum (NITsPV); Moscow Institute of Physics and Technology (State University); Institute of General and Inorganic Chemistry, Russian Academy of Sciences (IGIC RAS)

Email: fgupnicpv@mail.ru
Russian Federation, Moscow; Dolgoprudnyi, Moscow Region; Moscow

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