Metrological Analysis of an Optoelectronic Monitoring System for Profilograms of Shells of Rotation

Abstract

Metrological analysis of optoelectronic monitoring systems for profilograms of shells of rotation was conducted. The optoelectronic systems that execute various methods for searching for the center of a part are examined. A mathematical model of a shell of rotation specified by the profilogram is considered. The dependence of absolute methodological error on this coefficient is derived from the modeling results, and conclusions are drawn regarding the feasibility of applying one or another system, depending on the required accuracy and speed.