Software-Hardware Systems for Measurement of Sample Displacements in Probe Microscopes

Abstract

Features of the measurement of displacements of a sample by the positioning system of a probe microscope for studies of segments of the surface exceeding the field of view of the microscope are examined. The need to match the positioning step size and the field of view of the microscope is demonstrated. The use of an accelerometer and of a method for statistical differentiation of overlapping images for measuring the displacement of a sample is described. It is shown that the reliability can be increased by combining the results of measurements obtained by these two methods.