Email this article The Use of Projection Methods of Multivariate Analysis in Eddy Current Thickness Measurement
- Authors: Egorov A.V.1, Polyakov V.V.1,2, Bortsova Y.I.1
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Affiliations:
- Altai State University
- Institute of Strength Physics and Materials Science, Siberian Branch of the Russian Academy of Sciences (ISPMS SB RAS)
- Issue: Vol 62, No 7 (2019)
- Pages: 629-635
- Section: Electromagnetic Measurements
- URL: https://journal-vniispk.ru/0543-1972/article/view/246754
- DOI: https://doi.org/10.1007/s11018-019-01670-6
- ID: 246754
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Abstract
Multifrequency eddy current measurements of the thickness of non-magnetic metallic materials with dielectric coatings have been carried out. Based on the principal component analysis, the influence of competing factors such as electrical conductivity, thickness of the metal substrate and thickness of the dielectric layer is separated. Using the projection method on latent structures, eddy current measurements have determined the numerical values of the thicknesses of aluminum and copper plates and dielectric coatings.
About the authors
A. V. Egorov
Altai State University
Author for correspondence.
Email: egav@bc.ru
Russian Federation, Barnaul
V. V. Polyakov
Altai State University; Institute of Strength Physics and Materials Science, Siberian Branch of the Russian Academy of Sciences (ISPMS SB RAS)
Email: egav@bc.ru
Russian Federation, Barnaul; Tomsk
Ya. I. Bortsova
Altai State University
Email: egav@bc.ru
Russian Federation, Barnaul
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