Measurement of DC and AC Response Curves of a Bipolar Transistor as a Function of Frequency

Abstract

We discuss improving the reliability of measured DC and AC response curves for a bipolar transistor as a function of frequency using the mass-produced 2T937 transistor (Russia) as an example. We describe preparations for measurement and the actual measurements in considerable detail. We provide experimental response curves for the 2T937 transistor. A special test (measurement) board was developed to prevent the measured response curves from being affected in any way by the transistor mount or interface hardware (power buses, soldering leads, matching devices, adapters, etc.). A bare transistor chip was used to eliminate any effect of the transistor package on the results and improve the size and weight specifications of devices using the 2T937 transistor. The transistor chip can be directly mounted to a test board whose topology is used to connect the transistor chip to the device. The microstripline board is designed to enable measurements to be performed in the microwave frequency band using a probe station with standard calibration.