Effect of translocations from Aegilops speltoides Tausch on resistance to fungal diseases and productivity in common wheat

Abstract

The effect of alien genetic material on resistance to fungal diseases and productivity traits was studied in the T. aestivum/Ae. speltoides common wheat introgression lines. The analysis of genomic composition of the lines by means of cytological Spelt1, pSc119.2, and pAs1 markers detected the presence of translocations in the chromosomes 5BL, 6BL, and 7D. The assessment of lines on susceptibility to the leaf rust and powdery mildew during three field seasons demonstrated that the lines containing the translocation fragments in the chromosomes 5B and 7D are completely resistant to the leaf rust population specific to the West Siberian region. The presence of the Ae. speltoides genetic material in the chromosome 7D provided a high level of resistance to powdery mildew. A positive effect of the translocation in the chromosome 5BL on such traits as the number of spikelets and grains per ear was demonstrated. A decrease in the thousand-grain weight was registered in all introgression lines independently of the chromosomal localization of alien chromatin. No negative effect on the studied traits was detected in lines with the translocation in the chromosome 7D except for thousand-grain weight, allowing them to be used as a source of disease resistance genes.