Email this article Intrinsic excitation effect for the Al and Mg samples XPS analysis
- Authors: Afanas’ev V.P.1, Gryazev A.S.1, Kaplya P.S.1, Andreyeva Y.O.1
-
Affiliations:
- National Research University “Moscow Power Engineering Institute,”
- Issue: Vol 10, No 1 (2016)
- Pages: 108-112
- Section: Article
- URL: https://journal-vniispk.ru/1027-4510/article/view/187799
- DOI: https://doi.org/10.1134/S102745101506004X
- ID: 187799
Cite item
Open Access
Access granted
Subscription Access
Abstract
DIIMFP extraction method based on the numerical solution of electron scattering is presented. DIIMFP data extracted from Reflected Electron Energy Loss Spectra (REELS) is used for Photoelectron spectroscopy (PES) calculations. Experimental data can be described accurately without any intrinsic excitation effect. Authors propose that intrinsic energy losses were introduced to face inaccuracies due to inadequate description of electron energy loss process.
About the authors
V. P. Afanas’ev
National Research University “Moscow Power Engineering Institute,”
Email: GryazevAS@gmail.com
Russian Federation, st. Krasnokazarmennaya 14, Moscow, 111250
A. S. Gryazev
National Research University “Moscow Power Engineering Institute,”
Author for correspondence.
Email: GryazevAS@gmail.com
Russian Federation, st. Krasnokazarmennaya 14, Moscow, 111250
P. S. Kaplya
National Research University “Moscow Power Engineering Institute,”
Email: GryazevAS@gmail.com
Russian Federation, st. Krasnokazarmennaya 14, Moscow, 111250
Y. O. Andreyeva
National Research University “Moscow Power Engineering Institute,”
Email: GryazevAS@gmail.com
Russian Federation, st. Krasnokazarmennaya 14, Moscow, 111250
Supplementary files
