Specific features of observing magnetization inhomogeneities on the surface of permalloy thin films by means of highly sensitive magnetic-force-microscopy probes


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Abstract

The results of studying regions of inhomogeneous magnetization on the surface of permalloy thin films with the use of fabricated highly sensitive probes of magnetic force microscopy (MFM) are presented. The technological features of manufacturing MFM probes with a high sensitivity to magnetic-field gradient are analyzed. Regions of ordering of the vertical component of the magnetic field are revealed, and domain walls are visualized in the thin films under study. Nanoscale measurements of the domain-wall thicknesses are performed.

About the authors

N. A. Djuzhev

National Research University of Electronic Technology MIET

Author for correspondence.
Email: nodanceak@mail.ru
Russian Federation, Moscow, 124498

A. M. Kozmin

National Research University of Electronic Technology MIET

Email: nodanceak@mail.ru
Russian Federation, Moscow, 124498

M. Yu. Chinenkov

National Research University of Electronic Technology MIET; OOO “Spintek”

Email: nodanceak@mail.ru
Russian Federation, Moscow, 124498; Moscow, 124498

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