Multibeam X-ray lithography to form deep regular microstructures


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Abstract

A method for the fabrication of regular microstructures with a high aspect ratio (for example, X-ray gratings) by direct multibeam vector recording in layers of an SU-8 resist is presented. An X-ray beam with a wavelength from 0.4 to 1.7 Å is used for recording. The features of the method are described. The fabricated samples of regular microstructures of the SU-8 resist and gold-plated X-ray masks are presented as finished products.

About the authors

B. G. Goldenberg

Budker Institute of Nuclear Physics

Author for correspondence.
Email: goldenberg@inp.nsk.su
Russian Federation, Novosibirsk, 630090

A. G. Lemzyakov

Budker Institute of Nuclear Physics

Email: goldenberg@inp.nsk.su
Russian Federation, Novosibirsk, 630090

A. G. Zelinsky

Institute of Solid State Chemistry and Mechanochemistry

Email: goldenberg@inp.nsk.su
Russian Federation, Novosibirsk, 630128

V. P. Nazmov

Budker Institute of Nuclear Physics

Email: goldenberg@inp.nsk.su
Russian Federation, Novosibirsk, 630090

V. F. Pindyurin

Budker Institute of Nuclear Physics

Email: goldenberg@inp.nsk.su
Russian Federation, Novosibirsk, 630090

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