Email this article Use of models of secondary X-ray fluorescence spectra to determine the measurement conditions in X-ray spectral methods of material analysis
- Authors: Romanov A.V.1,2, Stepovich M.A.1,3, Filippov M.N.4
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Affiliations:
- Tsiolkovsky Kaluga State University
- Bauman Moscow State Technical University
- Plekhanov Russian Economic University, Ivanovo Branch
- Kurnakov Institute of General and Inorganic Chemistry
- Issue: Vol 11, No 1 (2017)
- Pages: 211-215
- Section: Article
- URL: https://journal-vniispk.ru/1027-4510/article/view/191779
- DOI: https://doi.org/10.1134/S1027451017010335
- ID: 191779
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Abstract
The principles of construction and the components of a model of X-ray fluorescence signal generation are considered in this paper. It is shown that the developed model describes the X-ray spectra of various materials rather well. Issues with choosing the optimal parameters of measurements in the quantitative X-ray fluorescence analysis of individual samples using the constructed models are discussed.
About the authors
A. V. Romanov
Tsiolkovsky Kaluga State University; Bauman Moscow State Technical University
Author for correspondence.
Email: Lexus_Sad@mail.ru
Russian Federation, Kaluga, 248023; Kaluga, 248000
M. A. Stepovich
Tsiolkovsky Kaluga State University; Plekhanov Russian Economic University, Ivanovo Branch
Email: Lexus_Sad@mail.ru
Russian Federation, Kaluga, 248023; Ivanovo, 153025
M. N. Filippov
Kurnakov Institute of General and Inorganic Chemistry
Email: Lexus_Sad@mail.ru
Russian Federation, Moscow, 119991
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