Experimental and simulation investigations of the peculiarities of relativistic electron beam scattering at a small angle of incidence on a thin flat target
- Authors: Serov A.V.1, Koltsov A.V.1, Mamonov I.A.2
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Affiliations:
- Lebedev Physical Institute of the Russian Academy of Sciences
- National Research Nuclear University “MEPhI”
- Issue: Vol 11, No 5 (2017)
- Pages: 987-993
- Section: Article
- URL: https://journal-vniispk.ru/1027-4510/article/view/194145
- DOI: https://doi.org/10.1134/S1027451017050159
- ID: 194145
Cite item
Abstract
The refraction angles θd of electron beams passing through aluminum and thin flat copper foils and reflection angles θr are measured. A microtron with 7.4 MeV particles is used as a source of electrons. The angle between the particle trajectory and the target surface α is varied in the range 5°–30°. The dependences of the refraction and reflection angles on the α angle and foil thickness δ are measured. A dosimetric film is used to make pictures of cross sections of the electron beam scattered by a thin 50 μm copper foil. Image processing allows the spatial distributions of refracted and reflected particles to be obtained. The processes of relativistic electron scattering at a small angle of incidence on a flat target are simulated by the Monte Carlo method. The results of simulation are compared with experimental data. Particle scattering at a bimetallic target consisting of 200-μm aluminum and 70-μm lead layers are simulated. A dependence of the spatial-energy distributions on the order of metal layers placed along electron trajectories is found.
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About the authors
A. V. Serov
Lebedev Physical Institute of the Russian Academy of Sciences
Author for correspondence.
Email: serov@x4u.lebedev.ru
Russian Federation, Moscow, 119991
A. V. Koltsov
Lebedev Physical Institute of the Russian Academy of Sciences
Email: serov@x4u.lebedev.ru
Russian Federation, Moscow, 119991
I. A. Mamonov
National Research Nuclear University “MEPhI”
Email: serov@x4u.lebedev.ru
Russian Federation, Moscow, 115409
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