Investigations of the Growth Processes of Bismuth-Germanate Crystals (Bi12GeO20) from the Melt using the X-Ray Diffraction Characteristics of Natural Lateral Faces
- Authors: Mololkin A.A.1,2, Protsenko A.I.2,3, Blagov A.E.2,3, Vinogradov A.V.2, Lomonov V.A.2, Pisarevskii Y.V.2,3, Targonskii A.V.2,3, Eliovich Y.A.2,3
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Affiliations:
- National University of Science and Technology (MISiS)
- Shubnikov Institute of Crystallography, Scientific-Research Center “Crystallography and Photonics,”
- National Research Center “Kurchatov Institute,”
- Issue: Vol 12, No 1 (2018)
- Pages: 69-74
- Section: Article
- URL: https://journal-vniispk.ru/1027-4510/article/view/194764
- DOI: https://doi.org/10.1134/S1027451018010159
- ID: 194764
Cite item
Abstract
Single crystals of bismuth-germanate grown by the Czochralski method and possessing a combination of piezoelectric, electro-optical and magneto-optical characteristics are studied. The possibility of the non-destructive quality control of the grown crystals by X-ray diffraction investigation of their natural lateral faces is shown.
About the authors
A. A. Mololkin
National University of Science and Technology (MISiS); Shubnikov Institute of Crystallography, Scientific-Research Center “Crystallography and Photonics,”
Author for correspondence.
Email: anatoli.mololkin.sooth@mail.ru
Russian Federation, Moscow, 119049; Moscow, 119333
A. I. Protsenko
Shubnikov Institute of Crystallography, Scientific-Research Center “Crystallography and Photonics,”; National Research Center “Kurchatov Institute,”
Email: anatoli.mololkin.sooth@mail.ru
Russian Federation, Moscow, 119333; Moscow, 123182
A. E. Blagov
Shubnikov Institute of Crystallography, Scientific-Research Center “Crystallography and Photonics,”; National Research Center “Kurchatov Institute,”
Email: anatoli.mololkin.sooth@mail.ru
Russian Federation, Moscow, 119333; Moscow, 123182
A. V. Vinogradov
Shubnikov Institute of Crystallography, Scientific-Research Center “Crystallography and Photonics,”
Email: anatoli.mololkin.sooth@mail.ru
Russian Federation, Moscow, 119333
V. A. Lomonov
Shubnikov Institute of Crystallography, Scientific-Research Center “Crystallography and Photonics,”
Email: anatoli.mololkin.sooth@mail.ru
Russian Federation, Moscow, 119333
Yu. V. Pisarevskii
Shubnikov Institute of Crystallography, Scientific-Research Center “Crystallography and Photonics,”; National Research Center “Kurchatov Institute,”
Email: anatoli.mololkin.sooth@mail.ru
Russian Federation, Moscow, 119333; Moscow, 123182
A. V. Targonskii
Shubnikov Institute of Crystallography, Scientific-Research Center “Crystallography and Photonics,”; National Research Center “Kurchatov Institute,”
Email: anatoli.mololkin.sooth@mail.ru
Russian Federation, Moscow, 119333; Moscow, 123182
Ya. A. Eliovich
Shubnikov Institute of Crystallography, Scientific-Research Center “Crystallography and Photonics,”; National Research Center “Kurchatov Institute,”
Email: anatoli.mololkin.sooth@mail.ru
Russian Federation, Moscow, 119333; Moscow, 123182
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