Method for the X-ray Diffraction Diagnostics of Crystal Imperfections

Abstract

Images of crystal imperfections are experimentally studied depending on their location with the use of special perfect silicon single crystals, whose surface layers are deformed by rough mechanical treatment (grinding). A new X-ray diffraction method based on the interpretation of a section topogram is proposed for studying crystal imperfections. It is shown that thin lines in the topogram are produced by kinematic scattering, and its central band is a result of dynamic scattering, i.e., this method provides the simultaneous observation of both kinematic and dynamic X-ray scattering from the same crystal.