Email this article X-Ray Topography: Yesterday, Today, and Prospects for the Future
- Authors: Suvorov E.V.1
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Affiliations:
- Institute of Solid State Physics
- Issue: Vol 12, No 5 (2018)
- Pages: 835-852
- Section: Article
- URL: https://journal-vniispk.ru/1027-4510/article/view/195937
- DOI: https://doi.org/10.1134/S1027451018050026
- ID: 195937
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Abstract
X-ray topography is a set of X-ray diffraction techniques that make it possible to see images of defects, to determine their type and location in the volume of the crystal structure or on its surface, and to measure their main characteristics. The review discusses the possibilities, limitations, and prospects of X-ray topography methods.
About the authors
E. V. Suvorov
Institute of Solid State Physics
Author for correspondence.
Email: suvorov@issp.ac.ru
Russian Federation, Chernogolovka, Moscow oblast, 142432
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