Role of the Carbon Sublattice in n-SiС Conductivity Compensation


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Abstract

The formation of radiation defects in the silicon-carbide sublattice under irradiation with 15-MeV protons and 0.9-MeV electron is analyzed. Numerical simulation is carried out, and histograms of the distribution of the energy transferred to carbon recoil atoms are obtained. Two energy ranges are considered when analyzing the histograms. Single isolated Frenkel pairs with closely located components are produced in the low-energy range. The recoil atom energy is sufficient to produce a displacement cascade in the other range. As the energy of primary knocked-out atoms increases, the average distance between genetically related Frenkel pairs increases, and as a consequence, the fraction of pairs that do not recombine under irradiation increases. The recombination radius of the Frenkel pair in the carbon sublattice is estimated.

About the authors

V. V. Kozlovski

St. Petersburg State Polytechnical University

Author for correspondence.
Email: kozlovski@tuexph.stu.neva.ru
Russian Federation, St. Petersburg, 195251

A. E. Vasil’ev

St. Petersburg State Polytechnical University

Author for correspondence.
Email: electronych@mail.ru
Russian Federation, St. Petersburg, 195251

K. S. Davidovskaya

Ioffe Physical–Technical Institute, Russian Academy of Sciences

Author for correspondence.
Email: Davidovskaya.Klava@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021

A. A. Lebedev

Ioffe Physical–Technical Institute, Russian Academy of Sciences

Author for correspondence.
Email: shura.lebe@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021

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