Application of the Scale-Space Method in Studying Self-Organizing Structures

Abstract

The aim of this paper is to combine the scale-space method and the method of two-dimensional detrended fluctuation analysis to study the correlation properties of surfaces of self-organizing structures. A description of the proposed method for studying the correlation properties of the surface is given. Model surfaces are used to demonstrate operation of the scale-space method. The results of studying porous silicon films obtained using the developed procedure are given.