X-ray Absorption Spectroscopy Analysis of Heavy Metals by Means of a Silicon Detector

Abstract

A Si-PIN detector with longitudinal arrangement of the silicon wafer for detecting X-ray quanta with an energy of up to 100 keV is designed. Its resolution is estimated. An X-ray absorption spectroscopy method for the detection of heavy metals at the K-absorption edges is implemented using the designed detector. The results of measuring the thicknesses of lead and gold foils placed behind a shield by the X-ray absorption spectroscopy method and with a micrometer gauge are compared. The detection limits of heavy metals behind steel or aluminum shields are determined. The measurement error of the metal-foil thicknesses is estimated.