Study of Resonance Phenomena During Thin-Film Perforation upon the Passage of Multicharged Ions
- Авторы: Filippov G.M.1, Aleksandrov V.A.2, Stepanov A.V.3
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Учреждения:
- Moscow State Open University Cheboksary Polytechnic Institute
- Ulianov Chuvash State University
- Chuvash State Agricultural Academy
- Выпуск: Том 13, № 6 (2019)
- Страницы: 1280-1283
- Раздел: Article
- URL: https://journal-vniispk.ru/1027-4510/article/view/196586
- DOI: https://doi.org/10.1134/S1027451019060302
- ID: 196586
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Аннотация
The process of the perforation of a nanometer-thick film during passage of the wave packet of a multicharged ion is studied. It is shown that the resonant behavior of vibrations of the disk released from the film has a significant effect on the perforation process. The resonance mechanism is based on the “push-pull” process. A model of the strength of the polarization interaction between the film and the wave packet of the particle is proposed. The model makes it possible to estimate the threshold value of the force required to form a pore during the passage of a multicharged ion through the film.
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Об авторах
G. Filippov
Moscow State Open University Cheboksary Polytechnic Institute
Автор, ответственный за переписку.
Email: filippov38-gm@yandex.ru
Россия, Cheboksary, 428000
V. Aleksandrov
Ulianov Chuvash State University
Email: filippov38-gm@yandex.ru
Россия, Cheboksary, 428000
A. Stepanov
Chuvash State Agricultural Academy
Email: filippov38-gm@yandex.ru
Россия, Cheboksary, 428000
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