Effect of the bending of reflecting planes in crystals on the propagation of an anomalous wave in x-ray diffraction

I. A. Smirnova; Смирнова И. А.; E. V. Suvorov; Суворов Э. В.

doi:10.31857/S1028096024010153

Effect of the bending of reflecting planes in crystals on the propagation of an anomalous wave in x-ray diffraction

Авторлар: Smirnova I.A.¹, Suvorov E.V.¹
Мекемелер:
1. Osipyan Institute of Solid State Physics RAS
Шығарылым: № 1 (2024)
Беттер: 109-112
Бөлім: Articles
URL: https://journal-vniispk.ru/1028-0960/article/view/257070
DOI: https://doi.org/10.31857/S1028096024010153
EDN: https://elibrary.ru/DFTJBY
ID: 257070

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Аннотация

The effect of bending of reflection planes in crystals on the propagation of an anomalous wave in X-ray diffraction has been studied by numerical simulation methods. The bending sign of the reflection planes was found to affect radically the propagation of the X-ray wave field in the crystal. The Bormann effect was shown to be suppressed at certain bending parameters.

Негізгі сөздер

diffraction, interference, X-rays, crystal lattice, single crystals, interference fringes, crystal lattice defects, local deformations, bending of reflecting planes, bending sign

Толық мәтін

Авторлар туралы

I. Smirnova

Osipyan Institute of Solid State Physics RAS

Email: suvorov@issp.ac.ru
Ресей, 142432, Moscow Region, Chernogolovka

E. Suvorov

Osipyan Institute of Solid State Physics RAS

Хат алмасуға жауапты Автор.
Email: suvorov@issp.ac.ru
Ресей, 142432, Moscow Region, Chernogolovka

Әдебиет тізімі

Грушко Ю.С., Лапин Е.Г., Сумбаев О.И., Тю- нис А.В. // ЖЭТФ. 1978. Т. 74. Вып. 6. С. 2280.
Суворов Э.В., Смирнова И.А. // Поверхность. Рентген., синхротр. и нейтрон. исслед. 2008. № 10. С. 7.
Смирнова И.А., Суворов Э.В., Шулаков Е.В. // ФТТ. 2007. T. 49. Вып. 6. С. 1050.
Суворов Э.В. Смирнова И.А. // Поверхность. Рентген., синхротр. и нейтрон. исслед. 2021. № 12. С. 23. https://doi.org/10.31857/S1028096021120232
Хирт Дж., Лоте И. Теория дислокаций. М.: Атомиздат, 1972. 599 с.
Takagi S.J. // J. Phys. Soc. Jpn. 1969. V. 26. № 5. P. 1239.
Инденбом В.Л., Чуховский Ф.Н. // Кристаллография. 1971. Т. 16. № 6. С. 1101.
Инденбом В.Л., Чуховский Ф.Н. // УФН. 1972. Т. 107. № 2. С. 229.
Authier A. Dynamical Theory of X-ray Diffraction. Oxford: Oxford University Press, 2002. 674 p.

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Әрекет

1. JATS XML

Жүктеу

2. Fig. 1. Edge dislocation: a is a flat image of the local disorientation field [5] (m is the plane of mirror symmetry, n is the plane of color symmetry); b is the experimentally observed diffraction image [2] (Si single crystal with a thickness of 1810 microns, crystal surface (111), reflection 2_20, CuKa radiation).

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Метадеректер

3. Fig. 2. Three–dimensional image of the field of local disorientation of the β edge dislocation (a); two-dimensional sections parallel to the Yß plane at distances from the origin x1 = 35, x2 = -35 microns; b is a section parallel to the Xß plane at x = 0.

Жүктеу (414KB)

Метадеректер

4. Fig. 3. Diagram of the signs of bending of the reflecting planes used in the work: hkl – indices of the reflecting planes; R – radius of bending of the reflecting planes; Khkl – diffraction vector.

Жүктеу (145KB)

Метадеректер

5. Fig. 4. The relative intensity I/Type of the anomalous (Bormann) wave field in the center of the scattering triangle, depending on the bending radius R of the reflecting planes (normalized to the intensity of the ideal crystal Iid).

Жүктеу (119KB)

Метадеректер

6. Fig. 5. Numerical simulation of the wave field in the scattering triangle in the case of a thick crystal with different bending signs of the reflecting planes.

Жүктеу (93KB)

Метадеректер

7. Fig. 6. Fragments of the wave field in the scattering triangles of a thin crystal (150 microns), where normal and abnormal waves are present (numerical simulation).