Study of the Influence of Carbon Barrier Layers on the Structural and Reflective characteristics of Multilayer X-ray Mirrors Based on a Pair of Cr/V Materials

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Abstract

The paper presents the results of a study of the structural parameters and reflective characteristics of multilayer X-ray mirrors based on a pair of chromium and vanadium materials. These structures are optimized for the spectral range of 2.42–2.73 nm. An important practical application of such structures is X-ray microscopy, which allows the study of biological samples in real time. In this case, it is necessary to provide the highest possible reflectivity of X-ray mirrors in order to obtain the highest possible temporal resolution during biological research. In this work, it was shown that Cr/V structures have high sizes of transition regions (interfaces), which in turn reduce the reflectivity of the mirror. It was also found that the structure has symmetrical interface profiles between layers of different materials. To reduce the size of the transition regions, an interface engineering technique was used, within the framework of which barrier layers of carbon were added to the structure, which made it possible to significantly reduce the width of the interfaces, which, in turn, leads to an increase in the reflection coefficient.

About the authors

R. A. Shaposhnikov

Institute of Physics of Microstructures RAS

Email: shaposhnikov-roma@mail.ru
Afonino, Russia

V. N. Polkovnikov

Institute of Physics of Microstructures RAS

Afonino, Russia

N. I. Chkhalo

Institute of Physics of Microstructures RAS

Afonino, Russia

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