Investigation of Plane Defects in a Dielectric Wafer by Spectral-Domain Integral Equation Method


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The spectral-domain volume integral equation is used to develop a computer model for investigating the scattering properties of plane objects in the form of elliptical cylinders embedded in a dielectric wafer. The features of the model are demonstrated for particles of different materials and different shapes.

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V. Lopushenko

Faculty of Computational Mathematics and Cybernetics, Moscow State University

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Email: lopushnk@cs.msu.ru
俄罗斯联邦, Moscow

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