Email this article Investigation of Plane Defects in a Dielectric Wafer by Spectral-Domain Integral Equation Method
- Authors: Lopushenko V.V.1
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Affiliations:
- Faculty of Computational Mathematics and Cybernetics, Moscow State University
- Issue: Vol 28, No 1 (2017)
- Pages: 60-73
- Section: Article
- URL: https://journal-vniispk.ru/1046-283X/article/view/247562
- DOI: https://doi.org/10.1007/s10598-016-9345-y
- ID: 247562
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Abstract
The spectral-domain volume integral equation is used to develop a computer model for investigating the scattering properties of plane objects in the form of elliptical cylinders embedded in a dielectric wafer. The features of the model are demonstrated for particles of different materials and different shapes.
About the authors
V. V. Lopushenko
Faculty of Computational Mathematics and Cybernetics, Moscow State University
Author for correspondence.
Email: lopushnk@cs.msu.ru
Russian Federation, Moscow
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