Investigation of Plane Defects in a Dielectric Wafer by Spectral-Domain Integral Equation Method
- 作者: Lopushenko V.V.1
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隶属关系:
- Faculty of Computational Mathematics and Cybernetics, Moscow State University
- 期: 卷 28, 编号 1 (2017)
- 页面: 60-73
- 栏目: Article
- URL: https://journal-vniispk.ru/1046-283X/article/view/247562
- DOI: https://doi.org/10.1007/s10598-016-9345-y
- ID: 247562
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详细
The spectral-domain volume integral equation is used to develop a computer model for investigating the scattering properties of plane objects in the form of elliptical cylinders embedded in a dielectric wafer. The features of the model are demonstrated for particles of different materials and different shapes.
作者简介
V. Lopushenko
Faculty of Computational Mathematics and Cybernetics, Moscow State University
编辑信件的主要联系方式.
Email: lopushnk@cs.msu.ru
俄罗斯联邦, Moscow
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