Diffractometric method for determining the degree of crystallinity of materials

Abstract

A new method for determining the degree of crystallinity of a material from X-ray diffraction data has been developed. The method is based on estimating the rate of change in function I = f(2θ) in the entire range of scattering angles. A calculation is performed using the ratio of the integral modulus of the first derivative of intensity with respect to angle 2θ to the integral area under the diffraction pattern curve. The method was tested on two substances with known amorphous and crystalline components. A linear relationship is revealed between the specified ratio of crystalline and amorphous parts and the calculated crystallinity index. The proposed method allows one to estimate impartially and compare the degree of crystallinity for samples of different nature.