New method of automated statistical analysis of polymer-stabilized metal nanoparticles in electron microscopy images
- Authors: Shvedchenko D.O.1, Suvorova E.I.1
-
Affiliations:
- Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”
- Issue: Vol 62, No 5 (2017)
- Pages: 802-808
- Section: Crystallographic Software
- URL: https://journal-vniispk.ru/1063-7745/article/view/191381
- DOI: https://doi.org/10.1134/S1063774517050200
- ID: 191381
Cite item
Abstract
The efficiency of the synthesis and application of metal/nonmetal particles several nanometers in size, prepared in solutions and stabilized with polymers, can be increased by applying a reliable statistical analysis and determining particle-size distributions for different systems. A new method for processing electron microscopy images of nanoparticles ≤10 nm in size and the program Analyzer of Nanoparticles designed for rapid recognition and measurements are presented. The program combines two approaches: threshold image processing for particle recognition and fitting the model of the particles with neighborhood background to the real experimental images.
About the authors
D. O. Shvedchenko
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”
Author for correspondence.
Email: dmitrymephi@gmail.com
Russian Federation, Moscow, 119333
E. I. Suvorova
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”
Email: dmitrymephi@gmail.com
Russian Federation, Moscow, 119333
Supplementary files
