Email this article Experimental and Theoretical Study of the Triple-Crystal High-Resolution X-Ray Diffraction Scheme in Reciprocal Space Mapping Technique
- Authors: Seregin A.Y.1,2, Prosekov P.A.1,2, Chukhovsky F.N.1, Volkovsky Y.A.1,2, Blagov A.E.1,2, Kovalchuk M.V.1,2,3
-
Affiliations:
- Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences
- National Research Centre “Kurchatov Institute”
- St. Petersburg State University
- Issue: Vol 64, No 4 (2019)
- Pages: 545-552
- Section: Diffraction and Scattering of Ionizing Radiations
- URL: https://journal-vniispk.ru/1063-7745/article/view/194052
- DOI: https://doi.org/10.1134/S1063774519040175
- ID: 194052
Cite item
Open Access
Access granted
Subscription Access
Abstract
The triple-crystal high-resolution X-ray diffraction scheme has been experimentally and theoretically investigated using reciprocal space mapping. The procedure for calculating the spectral angular instrumental functions of diffractometer to take into account the influence of mirror, monochromator, analyzer, and slits on the intensity distribution near reciprocal lattice point is described. Good coincidence of calculated and experimental cross sections of reciprocal space maps (RSMs) is shown by an example of a perfect Si(110) single crystal.
About the authors
A. Yu. Seregin
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”Russian Academy of Sciences; National Research Centre “Kurchatov Institute”
Email: p.prosekov@gmail.com
Russian Federation, Moscow, 119333; Moscow, 123098
P. A. Prosekov
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”Russian Academy of Sciences; National Research Centre “Kurchatov Institute”
Author for correspondence.
Email: p.prosekov@gmail.com
Russian Federation, Moscow, 119333; Moscow, 123098
F. N. Chukhovsky
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”Russian Academy of Sciences
Email: p.prosekov@gmail.com
Russian Federation, Moscow, 119333
Yu. A. Volkovsky
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”Russian Academy of Sciences; National Research Centre “Kurchatov Institute”
Email: p.prosekov@gmail.com
Russian Federation, Moscow, 119333; Moscow, 123098
A. E. Blagov
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”Russian Academy of Sciences; National Research Centre “Kurchatov Institute”
Email: p.prosekov@gmail.com
Russian Federation, Moscow, 119333; Moscow, 123098
M. V. Kovalchuk
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”Russian Academy of Sciences; National Research Centre “Kurchatov Institute”; St. Petersburg State University
Email: p.prosekov@gmail.com
Russian Federation, Moscow, 119333; Moscow, 123098; St. Petersburg, 199034
Supplementary files
