Mathematical Simulation in Nuclear Technologies
| 期 | 标题 | 文件 | |
| 卷 79, 编号 14 (2016) | Modeling of radiation-induced charge trapping in MOS devices under ionizing irradiation |
 (Eng) |
|
| Petukhov M., Ryazanov A. | |||
| 1 - 1 的 1 信息 | |||
| 期 | 标题 | 文件 | |
| 卷 79, 编号 14 (2016) | Modeling of radiation-induced charge trapping in MOS devices under ionizing irradiation |
(Eng) |
|
| Petukhov M., Ryazanov A. | |||
| 1 - 1 的 1 信息 | |||