Mathematical Simulation in Nuclear Technologies
Issue | Title | File | |
Vol 79, No 14 (2016) | Modeling of radiation-induced charge trapping in MOS devices under ionizing irradiation |
![]() (Eng) |
|
Petukhov M.A., Ryazanov A.I. | |||
1 - 1 of 1 Items |
Issue | Title | File | |
Vol 79, No 14 (2016) | Modeling of radiation-induced charge trapping in MOS devices under ionizing irradiation |
![]() (Eng) |
|
Petukhov M.A., Ryazanov A.I. | |||
1 - 1 of 1 Items |