Fluctuations of induced charge in ionization detectors
- 作者: Samedov V.V.1
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隶属关系:
- National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)
- 期: 卷 79, 编号 9-10 (2016)
- 页面: 1402-1405
- 栏目: Engineering Design of Nuclear Physics Equipment
- URL: https://journal-vniispk.ru/1063-7788/article/view/191119
- DOI: https://doi.org/10.1134/S106377881609009X
- ID: 191119
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详细
Fluctuations of charge induced by charge carriers on the detector electrodes make a significant contribution to the energy resolution of ionization detectors, namely, semiconductor detectors and gas and liquid ionization chambers. These fluctuations are determined by the capture of charge carriers, as they drift in the bulk of the detector under the action of an electric field, by traps. In this study, we give a correct mathematical description of charge induction on electrodes of an ionization detector for an arbitrary electric field distribution in the detector with consideration of charge carrier capture by traps. The characteristic function obtained in this study yields the general expression for the distribution function of the charge induced on the detector electrodes. The formulas obtained in this study are useful for analysis of the influence of charge carrier transport on energy resolution of ionization detectors.
作者简介
V. Samedov
National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)
编辑信件的主要联系方式.
Email: v-samedov@yandex.ru
俄罗斯联邦, Kashirskoe sh. 31, Moscow, 115409
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